Determination of terrace size and edge roughness in vicinal Si{100} surfaces by surface-sensitive diffraction

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dc.contributor.authorSaloner, D.en_US
dc.contributor.authorMartin, Joe Allenen_US
dc.contributor.authorTringides, Michael C.en_US
dc.contributor.authorSavage, Donald E.en_US
dc.contributor.authorAumann, Christopher Eugeneen_US
dc.contributor.authorLagally, Max G.en_US
dc.date.accessioned2007-07-13T19:18:22Z
dc.date.available2007-07-13T19:18:22Z
dc.date.issued1987en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent1942175 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationThe following article appeared in Saloner, D., Martin, J.A., Tringides, M.C., Savage, D.E., Aumann, C.E., & Lagally, M.G. (1987). Determination Of Terrace Size And Edge Roughness In Vicinal Si{100} Surfaces By Surface Sensitive Diffraction. Journal Of Applied Physics, 61(8), 2884-93. and may be found at http://link.aip.org/link/?jap/61/2884en_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.337885en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/9128
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://jap.aip.orgen_US
dc.rightsCopyright 1987 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleDetermination of terrace size and edge roughness in vicinal Si{100} surfaces by surface-sensitive diffractionen_US

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