Inter- and intragrain transport measurements in YBa2Cu3O7-x deformation textured coated conductors
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Feldmann, D. Matthew
Larbalestier, David C.
Verebelyi, Darren T.
Zhang, Wei
Li, Qi
Riley, Gilbert N., Jr.
Feenstra, Ron
Goyal, Amit
Lee, Dominic F.
Paranthaman, M. Parans
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American Institute of Physics
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The following article appeared in Feldmann, D.M., Larbalestier, D.C., Verebelyi, D.T., Zhang, W., Li, Q., Riley, G.N., et al. (2001). Inter And Intragrain Transport Measurements In Y Ba2 Cu3 O7 X Deformation Textured Coated Conductors. Applied Physics Letters, 79(24), 3998-4000. and may be found at http://link.aip.org/link/?apl/79/3998