Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates
Loading...
Files
Date
Authors
Kim, Dong Min
Eom, Chang-Beom
Nagarajan, Valanoor
Ouyang, Jun
Ramesh, Ramamoorthy
Vaithyanathan, Venugopalan
Schlom, Darrell G.
Advisors
License
DOI
http://dx.doi.org/10.1063/1.2185614
Type
Journal Title
Journal ISSN
Volume Title
Publisher
American Institute of Physics Inc., Melville, NY 11747-4502, United States
Grantor
Abstract
Description
This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.
Keywords
Related Material and Data
Citation
The following article appeared in Kim, D.M., Eom, C.B., Nagarajan, V., Ouyang, J., Ramesh, R., Vaithyanathan, V., et al. (2006). Thickness Dependence Of Structural And Piezoelectric Properties Of Epitaxial Pb(Zr0.52 Ti0.48)O3 Films On Si And Sr Ti O3 Substrates. Applied Physics Letters, 88(14), 142904-. and may be found at http://link.aip.org/link/?apl/88/142904