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Automatic test data generation for control flow coverage using Boolean constraints

Files

Thesis presented to the Graduate Faculty; UW Platteville (2.25 MB)

Date

Authors

Weiler, Stefan C.

Advisors

del Pino, Alexander (Advisor)

Type

Thesis

Keywords

Automated test data generation, University of Wisconsin - Platteville: Master of Science - Computer Science, Modeling, Control flow coverage, UW Platteville - Master of Science - Computer Science

URI

http://digital.library.wisc.edu/1793/68673

Collections

UWP Master's Theses