Built-in self-test algorithm for row/column pattern sensitive faults in RAM's
| dc.contributor.author | Franklin, Manoj | en_US |
| dc.contributor.author | Saluja, Kewal K. | en_US |
| dc.contributor.author | Kinoshita, Kozo | en_US |
| dc.date.accessioned | 2007-07-13T19:27:27Z | |
| dc.date.available | 2007-07-13T19:27:27Z | |
| dc.date.issued | 1990 | en_US |
| dc.description | This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder. | en_US |
| dc.format.extent | 2043250 bytes | |
| dc.format.mimetype | application/pdf | en_US |
| dc.format.mimetype | application/pdf | |
| dc.identifier.citation | Franklin, M., Saluja, K. K., & Kinoshita, K. (1990). Built In Self Test Algorithm For Row/Column Pattern Sensitive Faults In Ram'S. Ieee Journal Of Solid State Circuits, 25(2), 514-524. | en_US |
| dc.identifier.doi | http://dx.doi.org/10.1109/4.52179 | en_US |
| dc.identifier.uri | http://digital.library.wisc.edu/1793/10330 | |
| dc.relation.ispartof | http://www.ieee.org/ | en_US |
| dc.relation.ispartof | http://ieeexplore.ieee.org/servlet/opac?punumber=4 | en_US |
| dc.rights | Copyright 1990 Institute of Electrical and Electronics Engineers | en_US |
| dc.rights | ©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. | en_US |
| dc.title | Built-in self-test algorithm for row/column pattern sensitive faults in RAM's | en_US |
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