Evaluation of diffusion-driven material property profiles using three-wavelength interdigital sensor
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Mamishev, Alexander V.
Du, Yanqing
Bau, Jason H.
Lesieutre, Bernard C.
Zahn, Markus
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http://dx.doi.org/10.1109/94.959702
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IEEE
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Mamishev, A.V., Du, Y., Bau, J.H., Lesieutre, B.C., & Zahn, M. (2001). Evaluation Of Diffusion Driven Material Property Profiles Using Three Wavelength Interdigital Sensor. Ieee Transactions On Dielectrics And Electrical Insulation, 8(), 785-98.