Quantifying the thickness of magnetically active layers using x-ray resonant magnetic scattering

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dc.contributor.authorBarnes, Bryan M.en_US
dc.contributor.authorLi, Zhiweien_US
dc.contributor.authorSavage, Donald E.en_US
dc.contributor.authorWiedemann, E.en_US
dc.contributor.authorLagally, Max G.en_US
dc.date.accessioned2007-07-13T19:15:34Z
dc.date.available2007-07-13T19:15:34Z
dc.date.issued2004en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent180048 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationThe following article appeared in Barnes, B.M., Li, Z., Savage, D.E., Wiedemann, E., & Lagally, M.G. (2004). Quantifying The Thickness Of Magnetically Active Layers Using X Ray Resonant Magnetic Scattering. Journal Of Applied Physics, 95(11 II), 6654-6656. and may be found at http://link.aip.org/link/?jap/95/6654en_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.1667868en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8762
dc.publisherAmerican Institute of Physics Inc., Melville, United Statesen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://jap.aip.orgen_US
dc.rightsCopyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleQuantifying the thickness of magnetically active layers using x-ray resonant magnetic scatteringen_US

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