Test scheduling and control for VLSI built-in self-test
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Craig, Gary L.
Kime, Charles R.
Saluja, Kewal K.
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http://dx.doi.org/10.1109/12.2260
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Craig, G. L., Kime, C. R., & Saluja, K. K. (1988). Test Scheduling And Control For Vlsi Built In Self Test. Ieee Transactions On Computers, 37(9), 1099-1109.