Direct observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scattering

dc.contributor.authorMacKay, James F.en_US
dc.contributor.authorTeichert, Christianen_US
dc.contributor.authorLagally, Max G.en_US
dc.date.accessioned2007-07-13T19:15:43Z
dc.date.available2007-07-13T19:15:43Z
dc.date.issued1997en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent16929 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationThe following article appeared in MacKay, J.F., Teichert, C., & Lagally, M.G. (1997). Direct observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scattering. In 41st Annual Conference on Magnetism and Magnetic Materials, 12-15 Nov. 1996, 81 (8), 4353-. and may be found at http://link.aip.org/link/?jap/81/4353en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8780
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://jap.aip.orgen_US
dc.rightsCopyright 1997 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleDirect observation of interface roughness dependence of interfacial magnetism using diffuse X-ray resonant magnetic scatteringen_US

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