Use of emissive probes in high pressure plasma

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dc.contributor.authorYan, Shiluoen_US
dc.contributor.authorKamal, Husainen_US
dc.contributor.authorAmundson, Jayen_US
dc.contributor.authorHershkowitz, Noahen_US
dc.date.accessioned2007-07-13T19:15:07Z
dc.date.available2007-07-13T19:15:07Z
dc.date.issued1996en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent147026 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationThe following article appeared in Yan, S., Kamal, H., Amundson, J., & Hershkowitz, N. (1996). Use Of Emissive Probes In High Pressure Plasma. Review Of Scientific Instruments, 67(12), 4130-4137. and may be found at http://link.aip.org/link/?rsi/67/4130en_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.1147559en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8702
dc.publisherAmerican Inst of Physics, Woodbury, NY, USAen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://rsi.aip.orgen_US
dc.rightsCopyright 1996 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleUse of emissive probes in high pressure plasmaen_US

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