Design and noise model for CCD-based, time-resolved PHA measurements
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Schooff, Ryan J.
Diem, Stephanie J.
Fonck, Raymond J.
Reinke, Matthew
Tritz, Kevin L.
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http://dx.doi.org/10.1063/1.1535246
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American Institute of Physics Inc
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The following article appeared in Schooff, R., Diem, S., Fonck, R., Reinke, M., & Tritz, K. (2003). Design and noise model for CCD-based, time-resolved PHA measurements. In Proceedings of the 14th Topical Conference on High - Temperature Plasma Diagnostics, Jul 8-11 2002, 74 (3 II), 2007-2010. and may be found at http://link.aip.org/link/?rsi/74/2007