Aperture Effects on Charged-Particles in a Magnetic-Field

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dc.contributor.authorWang, En Yaoen_US
dc.contributor.authorLi, W.Q.en_US
dc.contributor.authorLam, Shu Waien_US
dc.contributor.authorHershkowitz, Noahen_US
dc.date.accessioned2007-07-13T19:14:55Z
dc.date.available2007-07-13T19:14:55Z
dc.date.issued1991en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent528889 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationThe following article appeared in Wang, E.Y., Li, W.Q., Lam, S.W., & Hershkowitz, N. (1991). Aperture Effects On Charged Particles In A Magnetic Field. Journal Of Applied Physics, 70(5), 2570-2574. and may be found at http://link.aip.org/link/?jap/70/2570en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8676
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://jap.aip.orgen_US
dc.rightsCopyright 1991 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleAperture Effects on Charged-Particles in a Magnetic-Fielden_US

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