Coaxial current transformer for test and characterization of high-power semiconductor devices under hard and soft switching

dc.contributor.authorLyra, Renato O.C.en_US
dc.contributor.authorCardoso Filho, Braz J.en_US
dc.contributor.authorJohn, Vinoden_US
dc.contributor.authorLipo, Thomas A.en_US
dc.date.accessioned2007-07-13T19:24:16Z
dc.date.available2007-07-13T19:24:16Z
dc.date.issued2000en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent304535 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationLyra, R. O.C., Cardoso Filho, B. J., John, V., & Lipo, T. A. (2000). Coaxial Current Transformer For Test And Characterization Of High Power Semiconductor Devices Under Hard And Soft Switching. Ieee Transactions On Industry Applications, 36(4), 1181-1188.en_US
dc.identifier.doihttp://dx.doi.org/10.1109/28.855977en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/9910
dc.publisherInstitute of Electrical and Electronics Engineers Inc., Piscataway, NJ, USAen_US
dc.relation.ispartofhttp://www.ieee.org/en_US
dc.relation.ispartofhttp://ieeexplore.ieee.org/servlet/opac?punumber=28en_US
dc.rightsCopyright 2000 Institute of Electrical and Electronics Engineersen_US
dc.rights©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.titleCoaxial current transformer for test and characterization of high-power semiconductor devices under hard and soft switchingen_US

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