Dual constrained single machine sequencing to minimize total weighted completion time
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Pan, Yunpeng
Shi, Leyuan
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http://dx.doi.org/10.1109/TASE.2005.853474
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Institute of Electrical and Electronics Engineers Inc., Piscataway, NJ 08855-1331, United States
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Pan, Y., & Shi, L. (2005). Dual Constrained Single Machine Sequencing To Minimize Total Weighted Completion Time. Ieee Transactions On Automation Science And Engineering, 2(4), 344-356.