Strain-dielectric response of dielectrics as foundation for electrostriction stresses
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Lee, Ho Young
Peng, Yiyan
Shkel, Yuri M.
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http://dx.doi.org/10.1063/1.2073977
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American Institute of Physics
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The following article appeared in Ho Young Yiyan, L. Peng, & Shkel, Y.M. (2005). Strain Dielectric Response Of Dielectrics As Foundation For Electrostriction Stresses. Journal Of Applied Physics, 98(7), 74104-1. and may be found at http://link.aip.org/link/?jap/98/74104