Strain-dielectric response of dielectrics as foundation for electrostriction stresses

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dc.contributor.authorLee, Ho Youngen_US
dc.contributor.authorPeng, Yiyanen_US
dc.contributor.authorShkel, Yuri M.en_US
dc.date.accessioned2007-07-13T19:27:34Z
dc.date.available2007-07-13T19:27:34Z
dc.date.issued2005en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent163080 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationThe following article appeared in Ho Young Yiyan, L. Peng, & Shkel, Y.M. (2005). Strain Dielectric Response Of Dielectrics As Foundation For Electrostriction Stresses. Journal Of Applied Physics, 98(7), 74104-1. and may be found at http://link.aip.org/link/?jap/98/74104en_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.2073977en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/10346
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://jap.aip.orgen_US
dc.rightsCopyright 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleStrain-dielectric response of dielectrics as foundation for electrostriction stressesen_US

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