Statistical estimation and testing for variation root-cause identification of multistage manufacturing processes
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Zhou, Shiyu
Chen, Yong
Shi, Jianjun
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http://dx.doi.org/10.1109/TASE.2004.829427
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Institute of Electrical and Electronics Engineers Inc., Piscataway, United States
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Zhou, S., Chen, Y., & Shi, J. (2004). Statistical Estimation And Testing For Variation Root Cause Identification Of Multistage Manufacturing Processes. Ieee Transactions On Automation Science And Engineering, 1(1), 73-83.