Statistical estimation and testing for variation root-cause identification of multistage manufacturing processes

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dc.contributor.authorZhou, Shiyuen_US
dc.contributor.authorChen, Yongen_US
dc.contributor.authorShi, Jianjunen_US
dc.date.accessioned2007-07-13T19:16:04Z
dc.date.available2007-07-13T19:16:04Z
dc.date.issued2004en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent1249554 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationZhou, S., Chen, Y., & Shi, J. (2004). Statistical Estimation And Testing For Variation Root Cause Identification Of Multistage Manufacturing Processes. Ieee Transactions On Automation Science And Engineering, 1(1), 73-83.en_US
dc.identifier.doihttp://dx.doi.org/10.1109/TASE.2004.829427en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8826
dc.publisherInstitute of Electrical and Electronics Engineers Inc., Piscataway, United Statesen_US
dc.relation.ispartofhttp://www.ieee.org/en_US
dc.relation.ispartofhttp://ieeexplore.ieee.org/servlet/opac?punumber=8856en_US
dc.rightsCopyright 2004 Institute of Electrical and Electronics Engineersen_US
dc.rights©20xx IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.en_US
dc.titleStatistical estimation and testing for variation root-cause identification of multistage manufacturing processesen_US

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