The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum
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Enachescu, Marius
Carpick, Robert W.
Ogletree, D. Frank
Salmeron, Miquel
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American Institute of Physics
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The following article appeared in Enachescu, M., Carpick, R.W., Ogletree, D.F., & Salmeron, M. (2004). The Role Of Contaminants In The Variation Of Adhesion, Friction, And Electrical Conduction Properties Of Carbide Coated Scanning Probe Tips And Pt(111) In Ultrahigh Vacuum. Journal Of Applied Physics, 95(12), 7694-7700. and may be found at http://link.aip.org/link/?jap/95/7694