The role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuum

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dc.contributor.authorEnachescu, Mariusen_US
dc.contributor.authorCarpick, Robert W.en_US
dc.contributor.authorOgletree, D. Franken_US
dc.contributor.authorSalmeron, Miquelen_US
dc.date.accessioned2007-07-13T19:15:21Z
dc.date.available2007-07-13T19:15:21Z
dc.date.issued2004en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent615300 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationThe following article appeared in Enachescu, M., Carpick, R.W., Ogletree, D.F., & Salmeron, M. (2004). The Role Of Contaminants In The Variation Of Adhesion, Friction, And Electrical Conduction Properties Of Carbide Coated Scanning Probe Tips And Pt(111) In Ultrahigh Vacuum. Journal Of Applied Physics, 95(12), 7694-7700. and may be found at http://link.aip.org/link/?jap/95/7694en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8734
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://jap.aip.orgen_US
dc.rightsCopyright 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleThe role of contaminants in the variation of adhesion, friction, and electrical conduction properties of carbide-coated scanning probe tips and Pt(111) in ultrahigh vacuumen_US

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