Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes
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Larsen, Troy
Moloni, Katerina
Flack, Frank
Eriksson, Mark A.
Lagally, Max G.
Black, Charles T.
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http://dx.doi.org/10.1063/1.1452782
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American Institute of Physics
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The following article appeared in Larsen, T., Moloni, K., Flack, F., Eriksson, M.A., Lagally, M.G., & Black, C.T. (2002). Comparison Of Wear Characteristics Of Etched Silicon And Carbon Nanotube Atomic Force Microscopy Probes. Applied Physics Letters, 80(11), 1996-8. and may be found at http://link.aip.org/link/?apl/80/1996