Comparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probes

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dc.contributor.authorLarsen, Troyen_US
dc.contributor.authorMoloni, Katerinaen_US
dc.contributor.authorFlack, Franken_US
dc.contributor.authorEriksson, Mark A.en_US
dc.contributor.authorLagally, Max G.en_US
dc.contributor.authorBlack, Charles T.en_US
dc.date.accessioned2007-07-13T19:15:39Z
dc.date.available2007-07-13T19:15:39Z
dc.date.issued2002en_US
dc.descriptionThis material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.en_US
dc.format.extent245967 bytes
dc.format.mimetypeapplication/pdfen_US
dc.format.mimetypeapplication/pdf
dc.identifier.citationThe following article appeared in Larsen, T., Moloni, K., Flack, F., Eriksson, M.A., Lagally, M.G., & Black, C.T. (2002). Comparison Of Wear Characteristics Of Etched Silicon And Carbon Nanotube Atomic Force Microscopy Probes. Applied Physics Letters, 80(11), 1996-8. and may be found at http://link.aip.org/link/?apl/80/1996en_US
dc.identifier.doihttp://dx.doi.org/10.1063/1.1452782en_US
dc.identifier.urihttp://digital.library.wisc.edu/1793/8772
dc.publisherAmerican Institute of Physicsen_US
dc.relation.ispartofhttp://www.aip.orgen_US
dc.relation.ispartofhttp://apl.aip.org/en_US
dc.rightsCopyright 2002 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en_US
dc.titleComparison of wear characteristics of etched-silicon and carbon nanotube atomic-force microscopy probesen_US

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